At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

Micromachines, Free Full-Text

THE ARCHITECTURE OF THE TEST MODULE IN STR.

A high fault coverage test approach for communication channels in

Test strategy for the basic NoC topology.

Maximal Connectivity Test with Channel-Open Faults in On-Chip

Non-Blocking Testing for Network-on-Chip

At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

Delay Faults

A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip

Sixer: A low-overhead, fully-distributed test scheme with

PDF] At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

Micromachines, Free Full-Text

Efficient Design-for-Test Approach for Networks-on-Chip

At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs